This paper proposes a method for rendering objects coated with multilayer thin films, taking into consideration multiple reflection and refraction, interference, and absorption of light inside the films. The proposed method is based on wave optics, and is able to accurately visualize the optical effects of multilayer films consisting of not only dielectric, but also metallic and semiconductive materials. Optical properties of a SiO_2 film coating on a silicon base, and several kinds of multilayer films coating windowpanes, glasses, or teapots are visualized to demonstrate the usefulness of the proposed method.
Keywords: Multilayer thin film, Multiple reflection and refraction, Interference, Complex refractive index, Composite reflectance and transmittance